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Headline: Advantest’s New High-Productivity Memory Tester Integrates Burn-In and Memory-Cell Test Functions in One System
Location: San Jose, CA, US
Post Date: Mar 31, 2020 3:05 AM
TAG ID: pznews121970
DocID: 202003317873446-en.xml
Word Count: approx. 465 words
 
Advantest’s New High-Productivity Memory Tester Integrates Burn-In and Memory-Cell Test Functions in One System New H5620 Tester Designed to Address the Global Market’s Rapidly Growing Demand for DDR DRAM Units
 
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